Hosted By: Nanophotonics Technical Group
30 October 2017, 11:00 - 12:00
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Silicon nanophotonic chip has extraordinary optical effects, and now the technology is paving its way to impact our society. The IBM Photonic and Nanoscale systems Team has pushed the limits of fabrication and detection to sense ultra-small traces of methane released to our atmosphere. Tune in to this webinar hosted by the OSA Nanophotonics Technical Group to discover the transformation of a brilliant idea to a technology that is believed to perform reliable detection of pollutants in the atmosphere.
Tunable laser trace-gas spectroscopy has been effectively used in both environmental and medical applications, for its sensitivity and specificity. This webinar will feature a presentation from William Green of the IBM Thomas J. Watson Research Center describing how contemporary silicon photonics manufacturing and assembly can be leveraged for a cost-effective miniaturized spectroscopic sensor platform, and will outline uses in fugitive methane emissions monitoring.
What You Will Learn:
William Green, IBM Thomas J. Watson Research Center
Dr. Will Green is Senior Manager of the Materials, Devices, and Integrated Systems Department at the IBM Thomas J. Watson Research Center. He received the Ph.D. degree in Electrical Engineering from the California Institute of Technology in 2005. His primary research activities encompass design and enablement for optical devices and integrated optoelectronic systems, in support of next-generation high-speed optical interconnects. In addition, Dr. Green has studied near- and mid-infrared silicon photonic platforms for nonlinear optical generation and on-chip molecular trace gas spectroscopy, with applications to environmental monitoring. His work has been acknowledged through awards including the 2016 IBM Outstanding Technical Accomplishment Award, 2012 IBM Corporate Award, and the 2012 IEEE Photonics Society Young Investigator Award. Dr. Green has served on the technical organizing committees for numerous OSA and IEEE conferences. He is a Senior Member of both the IEEE and the OSA.