Why is magnification a misleading specification for inspection equipment and which specifications matter more? When are automated inspection solutions more reliable than manual solutions? When is interferometry needed in addition to microscopy? Do expanded beam interconnects eliminate the needs for these protocols? These and other questions will be explored.

This webinar is brought to you jointly by OptoTest and Sumix. OptoTest manufactures and services calibrated test equipment used in the manufacture and qualification of fiber optic cables. Sumix manufactures high-precision microscopes and interferometers and actively participates in standards development for optical inspection systems.

Sponsored By:

Speaker

Jonathan Novick, Director of Sales, OptoTest

Jonathan and has worked more than 30 years in the test and measurement industry. He has served in a variety of management positions at Hewlett-Packard/Agilent Technologies (now Keysight), Audio Precision and Avermetrics. His career has been focused on wave propagation in electrical, acoustical, and optical formats. He has received multiple awards for technical training on a variety of topics.

Jonathan holds a B.S. degree in Electrical Engineering from Rensselaer Polytechnic Institute.

Petro Shegedin, Ph.D., PDM and Metrology Team Lead, Sumix

Petro has been working in the fiber optic industry for over 8 years, and currently holds the position of Product Development Manager and Metrology Department Team Lead at Sumix Corporation. He participates in IEC meetings, industry-specific round robin tests, works on challenging issues in the field of fiber optic inspection using innovative approaches.

Petro holds a Ph.D. degree in Computer Systems and Components and a M.S. degree in Metrology and Information Measurement Systems.

The views expressed in this webinar do not reflect those of OIDA and The Optical Society.