23 September 2020, 11:00 - 12:00 EasternTime
In this webinar, we explore simple test setups to accurately measure IL and RL for various non-standard and emerging cable assemblies including: hybrid patch cords, unibody duplex (SN and MDC), ruggedized connectors, shuffles, loopbacks, and expanded beam connectors. We will also look at the new 3M expanded beam EBO connector in detail and show features that make it optimal for connectivity and installation.
Chris Heisler, CTO, OptoTest
Chris Heisler graduated from CalPoly San Luis Obispo with a Bachelor of Science in Electrical Engineering with a focus on Communications and Fiber Optics. He continued with his Master’s Degree at CalPoly in Digital Signal Processing and Photonics. Chris has been working in the fiber optics industry for 13 years, and currently holds the position of CTO at OptoTest Corporation, where he has helped to refine the return loss measurement process and push development of test equipment that satisfies customer’s needs. Chris is also a regular contributor to the TIA TR42 Fiber Optic Engineering Committees.
Paul LeBlanc, Senior Program Manager, 3M
Paul LeBlanc is a Senior Program Manager for 3M’s Electronics Materials Solutions Division. Working for 3M for over 20 years, he has focused on new product development for FTTH and data center optical fiber networks, xDSL broadband copper networks, and 4G wireless communication networks. LeBlanc has been granted 5 patents, and holds B.S., M.S, and PhD degrees in Electrical Engineering from Rice University.
The views expressed in this webinar do not reflect those of OIDA and The Optical Society.