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NTVUSA, LLC
FEATURED | Instrumentation and Metrology
Low Coherence Interferometry and Multi Wavelength Profilometry for Lens Assembly Process Control
By the use and combination of full field imaging and topography with single point IR temporal mode interferometry, Optical metrology systems can deliver all required 3D parameters for lens manufacturing and assembly. The multi wavelength approach allows to get topography at video acquisition speed rate while the IR interferometry gives thicknesses and gaps between lenses within an assembly.
Speaker
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Gilles Fresquet, Vice President, Optical Technologies, Fogale Nanotech Group
Gilles Fresquet has 35 years of engineering experiences in high tech. industry.
Back in the 80’s and 90’s, Gilles spent many years at Thomson and Motorola semiconductor in a variety of engineering and management roles in France and in the USA..
He then joined RECIF S.A (equipment supplier) as R&D manager and business development director.
He joined FOGALE Nanotech in 2008 and developed the Optical metrology semiconductor activities. He led the Unity-SC (FOGALE subsidiary) start-up phase as a CEO/CTO. He is now Fogale VP in charge of the Optical activities
He holds a MSc. In Physics and a PhD in semiconductor advanced materials. He holds 12 patents in both semiconductor process and metrology fields. He is the author of more 50 scientific publications related to process modeling, device solid state physics and optical metrology.
