Testing Cutting-Edge Optical Components With Cutting-Edge Technologies
5G telecommunication infrastructures around the globe rely heavily on photonic components, such as integrated photonics. These cutting-edge optical devices are present not only in the telecom landscape but are also considered for sensing, medical or quantum computing applications.
The spectral characterization of such components calls for new cutting-edge testing capabilities, going up a gear in testing speed without any compromise on accuracy or resolution.
In this presentation, I will showcase EXFO’s series of spectral testing solutions for active and passive optical components. I will focus on the CTP10 component testing platform, which is a fully integrated solution for spectral characterization. The latest modules available on the platform measure insertion loss and polarization dependent loss over an unprecedented wavelength range.
- High speed measurement with high accuracy and repeatability
- Integrated, easy to setup IL PDL solution
- Full telecom wavelength range
- Automation examples
François Couny, Product Line Manager, EXFO
François Couny joined EXFO in 2015 and he is involved in driving to market innovative optical solutions that help customers overcome challenges to test better and smarter. François started his career in 2001 as a test and measurement engineer at Blaze Photonics, a start-up company specialized in photonic crystal fiber. He went on to join Yenista Optics in 2010 with a focus on developing tunable laser sources and spectral solutions, including an optical spectrum analyzer and an optical component tester adapted to photonic integrated circuit characterization. Over the years, he has helped develop state-of-the-art equipment for spectral optical testing of both active and passive optical components. François holds a PhD in photonics from the Centre for Photonics and Photonic Material at the University of Bath (UK).
CTP10 - Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
CT440/440-PDL - Compact tester for fast and accurate characterization of passive optical components
OSA20 - Fastest diffraction-grating-based optical spectrum analyzer operating from 1250 to 1700 nm