Events
Santec USA Corporation
Instrumentation and Metrology
Beyond Imaging - OCT for Metrology, In-line Monitoring and FMCW LiDAR Applications
In this talk, I will introduce the concept of Optical Coherence Tomography (OCT) and show how Santec is applying this high speed, high sensitivity measurement technique to areas beyond the traditional cross-sectional imaging applications. Including:
- Metrology
- In-Line Monitoring
- FMCW LiDAR or Swept Source LiDARTM
Some illustrations of Santec technology applies to these fields will be included.
Speaker
Jonathan Evans, PhD., VP, Marketing and Sales, Santec USA Corporation
Jonathan Evans is the VP of Sales and Marketing for Santec USA. With Santec since 2001, Jonathan now has responsibility for managing Santec's sales operations in the North America including those in Photonics Test and Measurement, Optical Components, Imaging and Medical markets.
Throughout his career, Jonathan has been an advocate for optical technologies in a wide range of applications, a passion developed while attaining his Ph.D. in Laser Physics at the University of St Andrews, Scotland.
Company Profile
Santec is a global photonics engineering company and a leading manufacturer of Tunable Lasers, Swept Source OCT equipment, and LCOS devices. An innovator in tunable lasers, Santec products deliver high performance in test and measurement applications as well as for Optical Coherence Tomography, 3D sensing and LiDAR. Creating Optopia since 1979.
