Events
Phasics
Instrumentation and Metrology
Quadriwave Lateral Shearing Interferometry Wavefront Sensors for Tomorrow’s Challenges in Optics Metrology
- General description of the technology: Quadriwave Lateral Shearing Interferometry (QWLSI)
- Advantages/Drawbacks compared to current metrology standard
- Applications examples:
- Beam metrology: free space optical communication
- Optics metrology: wide angle lenses MTF measurements for consumer electronics and automotive industry, Transmitted Wavefront Error and Reflected Wavefront Error at optics design wavelength
- Quantitative Phase imaging applied to refractive index change mapping in materials, laser-engraved waveguides
Speaker
Valentin Genuer, Business Developer, Phasics
Valentin is an optical engineer and holds a PhD in photonics from Grenoble-Alpes University and CEA-LETI. He joined Phasics as a business developer in 2018 to spread Phasics’ expertise in wavefront measurement and analysis, strengthen clients’ relationship and explore new market opportunities.
Company Profile
Phasics is the leader in high resolution wavefront sensing. Taking advantage of its patented Quadri Wave Lateral Shearing Interferometry (QWLSI), it combines high accuracy and precision with unprecedented dynamics for wavefront measurement in optics metrology, laser beam testing, adaptive optics, and refractive index mapping in materials. From standalone wavefront sensors to fully integrated machines for production environment Phasics brings its expertise in metrology of complex optical systems for wavefront error, Modulation Transfer function and beam parameters measurement from UV to LWIR.
