Optical Fabrication and Testing (OF&T)

22 - 26 junho 2014
The Fairmont Orchid, Kohala Coast, Hawaii, USA

Resources: Committees

The Technical Program Committee Members are integral to the success of the meeting. As a volunteer you dedicate countless hours contacting colleagues to encourage submissions and reviewing papers. On behalf of OSA, its Board, and its entire staff, we extend enormous gratitude to the members of the Optical Fabrication and Testing (OF&T) Technical Program Committee.

Call for Papers Opens October 2013
Abstract and Summary Submissions Due 5 março 2014, 12:00 EST (Convert Time)
Peer Review
Program Committee Decisions
Authors Notified of Committee Decisions 9 April 2014
Online Program Planner Available 14 April 2014
Eligible Students: Apply for a Student Travel Grant
Postdeadline Abstract and Summary Submissions Due 3 junho 2014, 12:00 EDT (Convert Time)
Postdeadline Paper Notifications Sent
Hotel Reservation By 10 junho 2014
Register for the Meeting By 26 maio 2014
Postdeadline Authors Notified of Committee Decisions
Prepare to Present at the Meeting
Present at the Meeting 22 junho - 26 junho 2014

How to be Effective

  • Volunteer to preside
  • Assist during invitation process
  • Score all papers (excluding conflicts)
  • Volunteer to blog
  • Promote meeting
  • Encourage your peers to complete a submission for the meeting.
  • Mark your calendar and save dedicated time for the paper review process.  
  • To promote the meeting, solicit and encourage contributed papers
  • Suggest candidates for invited speakers
  • Support and adhere to meeting deadlines
  • Review and score submissions to help determine which submissions should be accepted for presentation
  • Support chairs’ effort to solicit funds from granting agencies and corporations.
  • Attend the meeting and participate in on-site wrap-up meetings


All documents listed below are located in the Resource Center on Sharepoint.

  • Chairs’ Manual
  • Fundraising Grant Information
  • Exhibit and Sponsorship Information
  • Peer Review Instructions
  • Scheduling Instructions


Stephen Jacobs, University of Rochester, United States
Dae Wook Kim, University of Arizona, United States
James Mooney, ITT Exelis, Inc, United States
Jessica Nelson, Optimax Systems Inc, United States
Jannick Rolland, University of Rochester, United States


Dave Aikens, Savvy Optics Corp., United States
Anthony Beaucamp, Chubu University ,
James Burge, University of Arizona, United States
Myung Cho, AURA NOAO, United States
Veera Dandu, Clarkson University & Intel Corporation, United States
Chris Evans, Univ of North Carolina at Charlotte, United States
Oliver Faehnle, FISBA OPTIK AG, Switzerland
William Goodman, Trex Enterprises Corp, United States
Ulf Griesmann, National Inst of Standards & Technology, United States
James Hadaway, University of Alabama in Huntsville, United States
Matthew Jenkins, Raytheon Company, United States
John Lambropoulos, University of Rochester, United States
Panomsak Meemon, Suranaree University of Technology, Thailand
Brigid Mullany, Univ of North Carolina at Charlotte, United States
Robert Parks, Optical Perspectives Group, United States
Francois Piche, QED Technologies, United States
Michael Ponting, PolymerPlus LLC, United States
Kathleen Richardson, University of Central FL-CREOL, United States
Sven Schröder, Fraunhofer IOF, Germany
Katie Schwertz, Edmund Optics, United States
Jim Schwiegerling, University of Arizona, United States
Shai Shafrir, Corning Incorporated, United States
Paul Shore, Cranfield University, United Kingdom
Erika Sohn, Instituto de Astronomia UNAM, Mexico
Tayyab Suratwala, Lawrence Livermore National Laboratory, United States
Flemming Tinker, Aperture Optical Sciences, United States
Ray Williamson, Ray Williamson Consulting, United States
Xue-Jun Zhang, Changchun Inst of Optic, Fine Mech & Phy, China
Weiyao Zou, ASML Optics LLC, United States