Fifty-Four OSA Members Elevated to Rank of Fellow

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14 January 2008

Fifty-Four OSA Members Elevated to Rank of Fellow

FOR IMMEDIATE RELEASE

Contact:
Lyndsay Meyer
The Optical Society
+1.202.416.1435
lmeyer@osa.org

Fifty-Four OSA Members Elevated to Rank of Fellow

WASHINGTON, Jan. 14 – The Optical Society of America (OSA) Board of Directors is pleased to announce that they have elevated 54 members to the rank of fellow. These members will be recognized individually at meetings throughout 2008. A listing of all 54 fellows appears below.

Any regular OSA member who has served with distinction in the advancement of optics is eligible for transfer to the class of fellow. OSA’s Fellows & Honorary Members Committee recommends candidates to the Board of Directors, based on nominations from current fellow members. The number of fellows is limited by the bylaws to 10 percent of the total membership.

“OSA Fellows represent the best of the field,” said Rod Alferness, OSA president. “I am proud to honor my colleagues with this distinction and recognize their accomplishments. Their contributions, leadership and dedication have made a dynamic impact on all of us who work in optics and photonics.”

This year’s fellows once again hail from around the globe, 20 of whom are affiliated with institutions outside the United States. Fellows are selected on a variety of criteria such as record of publications related to optics, service to OSA, achievements in optics and management ability.

Following is an alphabetical listing of OSA’s 2008 fellows. Specific information on each fellow’s accomplishments can be found at http://www.osa.org/awards_and_grants/fellow_members/recent_fellows/2008_Fellows.aspx.

Pierre Agostini, Ohio State University, USA
Polina Bayvel, University College London, United Kingdom
Paul R. Berman, University of Michigan, USA
Tim Birks, University of Bath, United Kingdom
Brett E. Bouma, Wellman Center for Photomedicine, Massachusetts
General Hospital, Harvard Medical School and Harvard-MIT
Division of Health Sciences and Technology, USA
Jean Paul Chambaret, Laboratoire d’Optique Appliquée LOA/Ecole Polytechnique, France
Angel Costela, Consejo Superior de Investigaciones Cientificas, Spain
Mario Dagenais, University of Maryland, USA
Larry R. Dalton, University of Washington, USA
Cornelia Denz, Universität Münster, Germany
Kishan Dholakia, University of St. Andrews, United Kingdom
Yujie J. Ding, Lehigh University, USA
Ronald G. Driggers, U.S. Army Night Vision and Electronic Sensors Directorate, USA
Gary S. Duck, Ventana Management Services, Canada
Richard I. Epstein, Los Alamos National Lab, USA
Shanhui Fan, Stanford University, USA
James L. Fergason, Fergason Patent Properties, USA
F. Javier Garcia de Abajo, Consejo Superior de Investigaciones Cientificas, Spain
Harald Giessen, University of Stuttgart, Germany
Leonid B. Glebov, University of Central Florida, USA
Sailing He, Zhejiang University, China, and Royal Institute of Technology, Sweden
Edwin J. Heilweil, National Institute of Standards and Technology, USA
Ralph B. James, Brookhaven National Laboratory, USA
Alex K-Y. Jen, University of Washington, USA
Franz X. Kärtner, Massachusetts Institute of Technology, USA
Philippe Lalanne, CNRS/Laboratoire Charles Fabry de Institut d’Optique, France

Michael S. Lebby, OIDA, USA
Michal Lipson, Cornell University, USA
Serge Luryi, State University of New York at Stony Brook, USA
Eric Mazur, Harvard University, USA
John J. McCann, McCann Imaging, USA
Arthur R. McGurn, Western Michigan University, USA
Paul F. McManamon, Air Force Research Laboratory, USA
Robert A. Minasian, University of Sydney, Australia
Kenzo Miyazaki, Kyoto University, Japan
Alan J. Morrow, BinOptics Corporation, USA
David J. Moss, University of Sydney, Australia
Charles R. Munnerlyn, VISX, Inc. (retired), USA
Kyle J. Myers, U.S. Food and Drug Administration, USA
John D. O’Brien, University of Southern California, USA
Howard A. Padmore, Lawrence Berkeley National Laboratory, USA
Xiaochuan Pan, The University of Chicago, USA
Eugene S. Polzik, Niels Bohr Institute, Denmark
Evgeny Popov, Institut Fresnel, France
Margaret D. Reid, University of Queensland, Australia
Steven L. Rolston, University of Maryland, USA
Timothy J. Schulz, Michigan Technological University, USA
Trevor J. Sears, Brookhaven National Laboratory and Stony Brook University, USA
Bruce W. Shore, Lawrence Livermore National Laboratory (retired), USA
Olav Solgaard, Stanford University, USA
Donna Strickland, University of Waterloo, Canada
Jonathan Tennyson, University College London, United Kingdom
Jeffrey Owen White, Army Research Laboratory, USA
Anatoly V. Zayats, The Queen’s University Belfast, United Kingdom

About OSA

Uniting more than 70,000 professionals from 134 countries, the Optical Society of America (OSA) brings together the global optics community through its programs and initiatives. Since 1916 OSA has worked to advance the common interests of the field, providing educational resources to the scientists, engineers and business leaders who work in the field by promoting the science of light and the advanced technologies made possible by optics and photonics. OSA publications, events, technical groups and programs foster optics knowledge and scientific collaboration among all those with an interest in optics and photonics. For more information, visit www.osa.org.