Optical Fabrication and Testing Committee

Applied Optics Committee
Jannick Rolland, Univ. of Central Florida, USA, Co-Chair

Chris Dainty, Natl. Univ. of Ireland Galway, Ireland
John Rogers, Optical Res. Associates, USA
Ozan Cakmakci, Univ. of Central Florida, USA
Leon Glebov, Univ. of Central Florida, USA

Fabrication Committee
Stephen Jacobs, Univ. of Rochester, USA Co-Chair

Jessica DeGroote, Optimax Systems, Inc., USA
Kevin Moeggenborg, Cabot Microelectronics Corp., USA
James Oliver, Univ. of Rochester, USA
Markus Schinhärl, Univ. of Applied Sciences Deggendorf, Germany
David Strafford, ITT Industries, USA
Tayyab Suratwala, Lawrence Livermore Natl. Lab, USA
Kazuya Yamamura, Osaka Univ., Japan
Allen Yi, Ohio State Univ., USA

Metrology Committee
Ulf Griesmann, NIST, USA, Co-Chair

Peter N. Blake, NASA/GSFC, USA
Seung-Woo Kim, KAIST, Korea
Thomas Milster, Univ. of Arizona, USA
Erik Novak, Veeco Systems, USA
Christof Pruss, ITO, Univ. Stuttgart, Germany
Rufino Diaz Uribe, UNAM, Mexico
Quandou Wang, NIST, USA
Jiwang Yan, Tohoku Univ., Japan