Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

Imaging and Applied Optics



Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

23 - 27 June 2013
Renaissance Arlington Capital View, Arlington, Virginia, USA

Applied Industrial Optics offers a different networking and knowledge-sharing experience with a focus on the utilization of photonics and optical technology to solve real world problems.

At AIO, academic and industrial researchers with experience in overcoming the challenges of deploying and commercializing new technology will interact with research groups striving to get their technology out of the lab.

AIO will provide a platform for industry-driven research and product development like no other. This conference is about creating a collaborative environment with the following flow of information:

1.) Companies, research groups, and/or individuals with new and innovative optical technologies can share their technology developments while gaining a better understanding of what is required to successfully apply them in real world environments.

2.) Companies, research groups, and/or individuals who have already successfully applied optical technologies within diverse market segments can share their experiences and lessons learned.

3.) Companies can stay abreast of new technologies in the development pipeline that will enhance their product offerings and/or reveal new potential applications and emerging markets.
 

Topic Categories

  • Applied Spectroscopy
  • Emerging Laser, Fiber, and Photonics Technologies
  • Emerging optical technologies beyond the typical VIS/NIR spectral bands
  • Instrumentation
  • Imaging Systems
  • Microsystems, e.g. MOEMS, opto-microfluidics
  • Stand-off,  long distance, and remote sensing
View the complete scope and list of topic categories to be considered.


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Jess Ford
Weatherford International Ltd
United States

Chair
Marion O'Farrell
SINTEF
Norway

Chair
Joseph Dallas
Avo Photonics Inc
United States

Program Chair
Sri Rama Prasanna Pavani
Arecont Visions
United States

Program Chair
Arel Weisberg
Energy Research Co
United States

Program Chair

View Full Committee List

IMPORTANT DATES

Advanced Registration 28 May 2013 23:59 EDT
Advanced Registration 28 May 2013
Postdeadline Abstract and Summary Submission 29 May 2013 12:00 EDT
Postdeadline Abstract and Summary Submission 29 May 2013
Hotel Reservation 21 June 2013 23:59 EDT
Hotel Reservation 21 June 2013
Schedule at a glance

Optical Fibre Sensors for Industrial Applications in the Safety and Security, PLENARY
Brian Culshaw, University of Strathclyde, United Kingdom
Abstract: Optical fibre sensors appeared over 40 years ago.  Important prospects lie in safety and security.  This talk will explore why, and highlight successes, false starts and areas where more is needed for user acceptance.

Jarkko Antila, VTT Technical Research Centre of Finland, Finland, Fabry-Perot Interferometer Spectral Engines for Imaging Applications, Invited

Nicholas Barbi, PulseTor, United States, Tajke-off Angle Imaging for Precise Image-X-ray Map Correlation in Scanning Electron Microscopy: The Applicaiton of Silicon Photomultipliers to Eelectron Imaging, Invited

Steven Buckley, TSI Inc., United States, Sorting of Aluminum and Scrap Metal using Laser-Induced Breakdown Spectroscopy, Invited

Francois Chateauneuf, Institut National d'Optique, Canada, AeroMap: LiDAR for Real-time Aerosol Mapping and Control, Invited

Gregory Duckworth, OptaSense, United States, Distributed Sensing Applications of Rayleigh Scattering in Fiber Optic Cables, Invited

Jess Ford, Weatherford International Ltd, United States, Downhole Fluid and Analysis and Chemometric, Invited

Kay Gastinger, Norges Teknisk Naturvitenskapelige Univ, Norway, Finding the Needle in the Haystack - Approaches for Detecting Small Defects on a Large Object, Invited

Gary Gimmestad, Georgia Tech Research Institute, United States, New Inversion Algorithms for Multi-Angle Lidar, Invited

Mike Hillier, Isomet Corp, United Kingdom, Exploring Acousto-Optic Devices and Applications: A Summary of AO Techniques and a Discussion on Present Day Applications in Science and Industry, Invited

Drew Hmiel, Solar Light, United States, Exposing Polymers to Xe arc UVA+B Focused Beams Enhances Accelerated Outdoor Simulations at Moderate Temperatures, Invited

View All Invited Speakers

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Congress Special Events

Congress Reception
Monday 24 June, 19.00 – 20.30
Join your fellow attendees for the Congress Reception. Enjoy delectable fare while networking. The reception is open to committee/presenting author/student and full conference attendees. Conference attendees may purchase extra tickets for their guest.
 
Joint Poster Sessions
Tuesday 25, June, 16.30 – 18.00
Posters are an integral part of the technical program and offer a unique networking opportunity, where presenters can discuss their results one-to-one with interested parties. Each author is provided with a 4 ft. × 8 ft. (1.22 m × 2.44 m) board on which to display the summary and results of his or her paper.
 
AIO & COSI Joint Session
Wednesday, 26 June, 11.00 – 13.00
 
AIO & IS Joint Sessions
Wednesday, 26 June, 14.30 – 19.00

OSA - The Optical Society