The design problems for OIC 2013 involve a new perspective on traditional color mirrors and a wavefront sensitive application that designers face regularly.
The first problem is a color mirror. This is not a traditional visible mirror that one would find in a display system, but a mirror that maintains the same perceived specular reflected color, under specific illumination, for a broad range of incident angles. Also, the color required is highly chromatic, which in some situations would fall outside of the color
gamut for many naturally colored objects.
The second problem is a high performance dichroic beamsplitter for the SWIR and MWIR wavelength region that must maintain its optical flatness after coating. In addition to optical constants, Young's modulus and Poisson's ratio are provided for the candidate coating materials and the designer must select materials that allow the spectral and
optical figure requirements to be met.
A web-based evaluation program is available for designers to evaluate their solutions to these problems before they are submitted. The submissions will be evaluated using the same program and presented at OIC 2013. As always, we hope designers will share their design approaches and insights.
For complete information view the OIC Design Problem PDF.
Submission Deadline: 18 March 2013
Karen Hendrix, JDSU, USA
Jennifer Kruschwitz, Rochester Institute of Technology, USA; JK Consulting, USA
For the 2013 Optical Interference Coatings Conference, we propose another challenging Manufacturing Problem. As in the past four successful OIC Manufacturing Problems, the objective of this problem is to provide valuable insight into the present state-of-the-art in the manufacturing of thin film optical coatings.
In the 2013 OIC Manufacturing Problem, the targeted wavelength bandwidth will be extended from 400nm - 700nm to 400nm - 1100nm. This extension reflects the reality of practical optical coatings that are often required to operate in more than one wavelength region and it will also provide additional challenges to the participants during their coating characterization, process controls and measurements.
As before, no suggestions are given with regard to the coating materials, the coating design and deposition processes. These are all for the participants to decide. The only basis for the evaluation of submitted samples will again be the measured performance, which will be carried out by two independent laboratories.
Please notify Li Li of the intent to participate in the manufacturing problem so that she can send you the required number of substrates (maximum three/team). The substrates are once again donated by Edmund Optics. If more substrates are required, the participants will have to purchase them on their own. A team of contestants can submit no more than three samples with different designs.
For complete information view the manufacturing problem PDF.
An Excel file (2013 OIC Manufacturing Problem.xls) is provided for participants to download the transmittance targets and for them to submit their index profile and measured transmittance data. When submitting data, please add the last name of the principle investigator to the above file name, for example, 2013 OIC Manufacturing Problem Doe.xls
Submission Deadline: 1 March 2013.
Li Li, National Research Council Canada, Canada
George Dobrowolski, National Research Council Canada, Canada
Given the lively response to and interesting results of past Measurement Problems and the long-term goal to create a body of information about potentials and limits of well-established measurement techniques, the 2013 Measurement Problem this time addresses measurements of an AR coating: The reflectance of a broadband AR system shall be determined.
The sample is a broadband AR system designed for operation from 400nm to 700nm at an angle of incidence near zero degrees. The coating is deposited onto one side of a 25mm diameter fused silica substrate of about 5 mm thickness.The samples will be sponsored by a German company which is active in the field of laser optics production and will be distributed by the Fraunhofer Institute Jena upon request of the Measurement Problem participant.
You must request samples by 30 November 2012 by contacting Angela Duparre.
For complete information view the measurement problem PDF
Submission Deadline: 20 March 2013
Angela Duparré, Fraunhofer Institute Angewandte Optik & Feinmechanik, Germany
Detlev Ristau, Laser Zentrum Hannover, Germany