Freeform Optics (Freeform)

Freeform Optics (Freeform)

07 - 11 June 2015
Renaissance Arlington Capital View Hotel, Arlington, Virginia, USA
The Freeform meeting will be held in September 2016. Check back in October 2015 for more information.

Freeform Optics explores the evolving impact of freeform optical surfaces on optical systems for both imaging and illumination. New fabrication techniques that create optical surfaces that are not surfaces of revolution open an expansive new space for optical systems. Particularly enabled systems include illumination systems, head-worn displays and mid- and long-wave pervasive surveillance systems. But optical testing methods for these new surfaces are lacking, and the theory and implementation of an aberration theory as a basis for optical design of these surfaces was only unraveled in 2012. The scope features work on the optical design of imaging systems with freeform surfaces, evolving methods for surface representation for illumination system optimization and a perspective on the new challenges these surface present to optical testing.

With the ever expanding successes from the introduction of freeform surfaces into both imaging and nonimaging (illumination) optical systems, there is innovative work being done in both academia and industry in all areas of optical system evolution including,

  • Optical design
  • Optical system simulation
  • Surface representation
  • Fabrication
  • Metrology
  • Optical system assembly
Invited speakers from both industry and academia will speak to the latest developments in these topics and more. 

Plenary Speakers

John Mather,  NASA Goddard Space Flight Center, USA
Nobel Prize Winner in Physics 2006

W.E. Moerner, Stanford University, USA
Nobel Prize Winner in Chemistry 2014

Shree Nayar, Columbia University, USA

View the plenary page for talk titles and abstracts.


James Burge, University of Arizona, United States, Simultaneous Measurement of Both Surfaces of Conformal Windows using Flexible Optical Ray Metrology , Invited

William Cassarly, Synopsys, Inc, United States, Assessing Freeform Illumination Surface Tolerances, Invited

Michael Chrisp, Massachusetts Inst of Tech Lincoln Lab, United States, Imaging with NURBS Freeform Surfaces , Invited

Lovell Comstock, Corning Incorporated, United States, Manufacturing Large Stable Multi Spectral Coated Lightweight Freeform Optics , Invited

Matt Davies, Univ of North Carolina at Charlotte, Ultra-Precision diamond machining of freeform optics for the IR , Invited

Thomas Dresel , Zygo Corporation, Form metrology of Toric Surfaces using Scanning Fizeau Interferometry, Invited

Fabian Duerr, Vrije Universiteit Brussel, Belgium, Potential Benefits of Freeform Optics in On-Axis Imaging Applications, Invited

Paul Dumas, QED Technologies Inc, United States, How MRF and SSI can benefit Freeform Manufacturing , Invited

Chris Evans, Univ of North Carolina at Charlotte, United States, Freeform Optical Surfaces: Metrology Capabilities and Challenges, Invited

Alan Greynolds, United States, Battle of the Biconics: Comparison and Application of Various Anamorphic Optical Surfaces, Invited

Alois Herkommer, Universität Stuttgart, Germany, Visualizing Surface Aberration Contributions in Freeform Systems , Invited

Joseph Howard, NASA Goddard Space Flight Center, United States, Freeform Optics at NASA, Invited

Marc Huebner, Auer Lighting GmbH, Freeform Surfaces Manufactured in Glass: Combining Theory and Practice , Invited

James McGuire, Jet Propulsion Laboratory, United States, A fast, wide-field of view, freeform TMA: design, tolerance analysis, and primary mirror fabrication" , Invited

Christoph Menke, Carl Zeiss AG, Germany, Optical Design with Orthogonal Freeform Representations, Invited

Juan Carlos Miñano, Universidad Politécnica de Madrid, Spain, Recent Advances in Imaging SMS Designs , Invited

Jessica Nelson, Optimax Systems Inc, United States, Optical Tolerance Suggestions to Make Freeform Optics Easier to Fabricate and Test , Invited

Dennis Ochse, JENOPTIK Optical Systems GmbH, United States, Describing freeform surfaces with orthogonal functions , Invited

Fetze Pijlman, Philips Research, Netherlands, Free Shape Optics on Flat Surfaces , Invited

Jie Qiao, Rochester Institute of Technology, United States, Performance Analysis of an Optical Differentiation Wavefront Sensor and its Applications to the Metrology of Freeform Optics , Invited

Harald Ries, Optics & Energy Concepts, Germany, Freeform Optics Tailored to Illumination Tasks , Invited

Katrin Schroll, Osram GmbH, Germany, Development of a freeform 3-zone streetlight reflector , Invited

Jim Schwiegerling, University of Arizona, United States, Ophthalmic Applications of Freeform Optics , Invited

David Shafer, United States, A Fast Speed, Wide-Angle, Freeform Aspheric Reflective Telescope with External Front Pupil, Invited

Stefan Sinzinger, Technische Universität Ilmenau, Germany, Freeform and Array Optics - Form Design to Application , Invited

Jan ten Thije Boonkkamp, Eindhoven University of Technology, The Monge-Ampere Equation for Freeform Optics , Invited

David Williamson, Nikon Research Corporation of America, United States, Freeforms in EUV Lithography Projection Optics , Invited

Rengmao Wu, University of Arizona, United States, The Monge-Ampere Equation Design Method and Its Application to Beam Shaping , Invited

View All Invited Speakers

Conference Plenary Sessions
Tuesday, 9 June, 08:00 - 09:30
John Mather,  NASA Goddard Space Flight Center, USA
Shree Nayar, Columbia University, USA
Wednesday, 10 June, 09:00 – 10:00
W.E. Moerner, Stanford University, USA
Conference Reception
Monday, 8 June, 19:00 – 20:30
Join your fellow attendees for the Congress Reception. Enjoy delectable fare while networking. The reception is open to committee/presenting author/student and full conference attendees. Conference attendees may purchase extra tickets for their guest.
Joint Poster Session
Tuesday, 9 June, 19:00 – 20:30
Posters are an integral part of the technical program and offer a unique networking opportunity, where presenters can discuss their results one-to-one with interested parties. Each author is provided with a board on which to display the summary and results of his or her paper.

OSA - The Optical Society