Freeform Optics


Freeform optics is a growing are in the field of optical design.  It typically denotes optical surfaces that are not rotationally symmetric, and such surfaces are increasingly being used in both imaging and nonimaging systems.  There are three facets to the use of freeform surfaces: design, fabrication, and testing.  Fabrication methods for freeform surfaces have paced this field, but design and testing methods are also quickly advancing.  The focus of this conference is design methods, but there are also talks on fabrication and testing.  This conference starts with a plenary by Prof. Jannick Rolland followed by informative talks to introduce the audience to the field.  Following there are two sessions dedicated to imaging optical design, two to illumination design, one each for fabrication and testing methods, and as session on special and emerging topics in the field.  Additionally, there is a single poster session for the congress, in which there are a number of freeform optics offerings.  A number of invited talks span the three days of this engaging conference, including presentations on aberrations of freeform surfaces, imaging and nonimaging design methods, beam shaping, manufacturing techniques, direct measurement of surfaces, and dynamic freeform surfaces.  This meeting will bring together these three communities to discuss this exciting field of optical engineering. 

Jannick P. Rolland, University of Rochester, USA - PLENARY

The Past, Present and Future of Freeform Optics
Freeform optical surfaces are emerging as a path to truly three-dimensional optical designs. In this talk I will provide a short historical context to this emergence and discuss the challenges as well as the rapidly emerging knowledge that spans from the mathematics of freeform surfaces to the implementation of freeform optical systems.

Steve Mulder, Photon Engineering, USA - TUTORIAL

E: Graphical Methods for Designing Optics in CAD
A number of simple graphical methods for designing optics in CAD are presented. These methods are based on the law of reflection, Snell’s Law, Fermat’s principle and a property of focal conics. These graphical methods will be illustrated using the practical example of designing a catadioptric LED collimator.

Pablo Benitez, Universidad Politecnica de Madrid, Spain, Sharp imaging of Multiple object pointS: How and Why, Invited

James Burge, University of Arizona, United States, Developments Related to Design, Fabrication, and Measurement of Freeform Optical Components , Invited

Cristina Canavesi, University of Rochester, United States, Application of Conic Intersection Properties to Freeform Reflector Design, Invited

William Cassarly, Synopsys, Inc, United States, Freeform Surface Parameterization for Illumination , Invited

Angela Davies, Univ of North Carolina at Charlotte, United States, Mid-spatial Frequency Specification and Characterization for Freeform Surfaces, Invited

Paul Dumas, QED Technologies Inc, United States, Enabling Higher Precision Freeform Surfaces though Developments in Characterization, MRF, and Stitching Interferometry, Invited

Gregory Forbes, QED Technologies Inc, Australia, Detrending on Steroids... MSF Characterization via Freeform Polynomials", Invited

Kyle Fuerschbach, University of Rochester, United States, Realizing Freeform: An LWIR Imager in a Spherical Package, Invited

Paul Glenn, Bauer Associates Inc, United States, Meeting the Conflicting Requirements for Direct Measurement of Freeform Optics - High Accuracy, Long Range, and High Slope Tolerance, Invited

Gerhard Kelch, Carl Zeiss Vision GmbH, Germany, Freeform Surfaces for Progressive Spectacle Lenses, Invited

View All Invited Speakers


John Koshel, Photon Engineering LLC, United States
Kevin Rolland-Thompson, Synopsys, Inc, United States


James Burge, University of Arizona, United States
Angela Davies, Univ of North Carolina at Charlotte, United States
Chris Evans, Univ of North Carolina at Charlotte, United States
Gregory Forbes, QED Technologies Inc, Australia
Joseph Howard, NASA Goddard Space Flight Center, United States
David Jenkins, Synopsys, Inc, United States
Jannick Rolland, University of Rochester, United States
Mitchell Ruda, Ruda-Cardinal, Inc, United States
Jose Sasian, University of Arizona, United States
H. Philip Stahl, NASA Marshall Space Flight Center, United States
Wilhelm Ulrich, Carl Zeiss AG, Germany
Andrew Wood, Qioptiq Ltd, United Kingdom