Optical Fabrication and Testing

09 - 13 July 2017
Denver Marriott City Center, Denver, Colorado United States

Invited Speakers

Andreas Beutler, Mahr GmbH, Germany, Referencing and Form Measurements of Freeform Optics, Invited

Glen Cole, Thirty Meter Telescope, United States, Optical Fabrication and Metrology for the Thirty Meter Telescope Primary Mirror Segments, Invited

Turan Erdogan, Plymouth Grating Laboratory, Inc., United States, Manufacturing Large-format Spherical and Cylindrical Laser Focusing Gratings using Scanning-beam Interference Lithography, Invited

Oliver Faehnle, FISBA AG, Switzerland, Machine Acceleration Effects on Computer Controlled Polishing, Invited

James Fienup, University of Rochester, United States, Phase Retrieval for Optical Metrology: Past, Present and Future, Invited

Mohammadreza Khorasaninejad, Harvard University, United States, Optics with Metasurfaces: Beyond Refractive and Diffractive Optics, Invited

Manyalibo Matthews, Lawrence Livermore National Laboratory, United States, IR Laser Processing Techniques for NIF Optics, Invited

Cormic Merle, United States, Metrology for the LSST M2: Large Holographic Stitching Technique, Invited

Brigid Mullany, Univ of North Carolina at Charlotte, United States, Fiber Based Polishing Tools for Optical Applications, Invited

Mahito Negishi, Canon Inc, Japan, New Stitching Algorithm using an Approximated Reference Shape, Invited

Joseph Owen, Univ of North Carolina at Charlotte, Diamond Milling of IR Materials, Invited

Jyrki Saarinen, University of Eastern Finland, Finland, Additive Manufacturing for Small and Medium Sized Optics, Invited

John Schaefer, Raytheon EO Innovations, United States, Advances in Diamond Turning, Invited

Sven Schröder, Fraunhofer IOF, Germany, Surface Characterization of High-End Optical Components using Light Scattering, Invited

Robert Smythe, Apre Instruments, United States, Interferometric Measurement of Mid-Spatial Frequency Wavefront Errors, Invited

Simon Thiele, University of Stuttgart, ITO, Germany, Complex Micro-optics by Femtosecond Direct Laser Writing, Invited

Jurgen Van Erps, Vrije Universiteit Brussel, Belgium, Prototyping and Replication of Polymer Freeform Optical Components, Invited

Reinhard Voelkel, SUSS MicroOptics SA, Switzerland, Novel Fabrication and Testing Methods for Micro Optics, Invited

Christian Weingarten, Fraunhofer ILT, Combination of Laser-based Process Steps for Optics Manufacturing, Invited

Richard Youngworth, Riyo LLC, United States, Adopting and Using Optical Standards, Invited