Optical Fabrication and Testing

09 - 13 July 2017
Denver Marriott City Center, Denver, Colorado United States

Committee List


Jessica DeGroote Nelson, Optimax Systems Inc, United States
Matthew Jenkins, Raytheon Company, United States
Dae Wook Kim, The University of Arizona, United States


Dave Aikens, Savvy Optics Corp, United States
Andreas Beutler, Mahr GmbH, Germany
Myung Cho, AURA NOAO, United States
Tolis Deslis, JENOPTIK Optical Systems, LLC, United States
Jonathan Ellis, University of Rochester, United States
Chris Evans, Univ of North Carolina at Charlotte, United States
Oliver Faehnle, FISBA AG, Switzerland
Eric Fest, The University of Arizona, United States
Kyle Fuerschbach, Sandia National Laboratories, United States
Ulf Griesmann, National Inst of Standards & Technology, United States
Sven Kiontke, Asphericon GmbH, Germany
James Mooney, Harris, United States
Soojong Pak, Kyung Hee University, South Korea
Michael Ponting, Peak Nano Optics, United States
Christof Pruss, Universität Stuttgart, Germany
Jannick Rolland, University of Rochester, United States
Sven Schröder, Fraunhofer IOF, Germany
Katie Schwertz, Edmund Optics, United States
Tayyab Suratwala, Lawrence Livermore National Laboratory, United States
Hideo Takino, Chiba Institute of Technology, Japan
Flemming Tinker, Aperture Optical Sciences, United States
Ray Williamson, Ray Williamson Consulting, United States