Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

Applied Industrial Optics offers a different networking and knowledge-sharing experience with a focus on the utilization of photonics and optical technology to solve real world problems.

At AIO, academic and industrial researchers with experience in overcoming the challenges of deploying and commercializing new technology will interact with research groups striving to get their technology out of the lab. Technical topics include instrumentation, imaging systems, applied spectroscopy, and emerging laser, fiber, and photonics technologies.

Topic Categories

  • Applied Spectroscopy
  • Emerging Laser, Fiber, and Photonics Technologies
  • Emerging optical technologies beyond the typical VIS/NIR spectral bands
  • Instrumentation
  • Imaging Systems
  • Microsystems, e.g. MOEMS, opto-microfluidics
  • Stand-off,  long distance, and remote sensing
  • Optical Sensing


Bernard Kress, GoogleUnited StatesSee Through Optical Architectures for Wearable Displays, Plenary

David Allen, National Inst of Standards & TechnologyUnited StatesStandards and Methods for the Evaluation of Hyperspectral Imaging System Performance, Invited

Sterling Backus, Kapteyn-Murnane LaboratoriesUnited StatesHigh Peak and Average Power Near/Mid-IR Femtosecond Laser Sources, Invited

Kate Bechtel, Triple Ring TechnologiesUnited StatesSpatially-Resolved Diffuse Reflectance Measurements for Oximetry, Invited

Rene Beigang, Technische Universität KaiserslauternGermanyIndustrial Applications of Terahertz Technology: From layer thickness measurements to mail screening, Invited

David Brady, Duke UniversityUnited StatesRoadmap for Commercial Gigapixel Cameras, Invited

Alexandre Brolo, University of VictoriaCanadaTailoring Metallic Nanostructures for Surface-Enhanced Spectroscopy, Invited

Steven Buckley, TSI Inc.United StatesLIBS in the Laboratory and Beyond , Invited

Hui Cao, Yale University United StatesUsing the Random Nano-photonic Structure on a Silicon Chip to make a Spectrometer, Invited

Brian Cunningham, Univ of Illinois at Urbana-ChampaignUnited StatesSmartphone Biosensors for Health, Environment, and Food Safety, Invited

Peter de Groot, Zygo CorporationUnited StatesThe State of the Art in Interference Microscopy: Modern Techniques for Geometric Form, Surface Texture and Areal Structure Analysis, Invited

J. Steven Dodge, Simon Fraser UniversityCanadaPaper Parameter Estimation Using Time-domain Terahertz Spectroscopy, Invited

Douglas Elmore, 3M CompanyUnited StatesMultivariate Analysis of Vibrational Spectra in Industrial Research, Invited

Pietro Ferraro, Istituto Nazionale di Ottica (CNR)ItalyDetection of Survivors in Fire Scenes by Mid-IR Digital Holography, Invited

Tigran Galstian, Universite LavalCanadaMotion-less Adaptive Optical Systems Based on Liquid Crystals: From fundamentals to mobile applications, Invited

Manish Gupta, Los Gatos Research IncUnited StatesDevelopment of Cavity-Enhanced Absorption Spectroscopy Analyzers for Industrial Applications, Invited

Stewart Hager, Hager Environmental & Atmospheric TechnoUnited StatesQuantification and Relative Amounts of Pollutants in Vehicle Exhaust Plumes, Invited

Robert Hart, OptoFluidicsUnited StatesAdvanced Nanoparticle Measurement using Near Field Light, Invited

Angus Henderson, Lockheed Martin Aculight CorpUnited StatesFiber-laser-based Widely-tunable Sources for the Visible, Invited

Peter Höjerback, SerstechSwedenMiniature Raman Spectrometers, Invited

Katerina Krebber, Federal Institute for Materials ResearchGermanyFiber Optic Sensors - From Laboratory to Industrial Applications, Invited

Christoph Mertz, Carnegie Mellon UniversityUnited StatesObserving Optically Challenging Objects with Structured Light, Invited

Dominic Murphy, Pie Photonics, LtdIrelandStatic Optical Interferometry: Evolution, challenges and opportunities, Invited

Faiz Rahman, Electrospell LtdUnited KingdomCurrent Developments and Future Trends in Diode-driven Solid-state Lighting, Invited

Brandon Redding, Yale University United StatesUsing a Multimode Fiber as Compact, High-resolution Spectrometer, Invited

Jonathan Saint Clair, Boeing CompanyUnited StatesChallenges for Optical Metrology in the Aerospace Industry, Invited

Richard Sharp, RedShift Systems CorporationUnited StatesTunable QCLs with Intra-Cavity MEMS Filters for Spectroscopic Applications, Invited

Dmitry Starodubov, POCUnited StatesZBLAN Fibers: From Zero Gravity Tests to Orbital Manufacturing, Invited

Albert Stolow, National Research Council CanadaCanadaMultimodal Coherent Nonlinear Optical Microscopy: From Biophotonics to Geophotonics, Invited

Jeff Throckmorton, Ocean Optics Inc.United StatesReducing the MacAdam Ellipses, Invited

Mariano Troccoli, Adtech Optics IncUnited StatesHigh Power and Single Mode Quantum Casade Lasers for Industrial Applications, Invited

Mark Witinski, Harvard UniversityUnited StatesMonolithic Tuning of Quantum Cascade Lasers for Compact Infrared Spectroscopy Applications: From Design Considerations to Results, Invited

Changhuei Yang, California Institute of TechnologyUnited StatesFourier Ptychographic Microscopy: Large field-of-view and high resolution microscopy imaging, Invited

Chenying Yang, University of WashingtonUnited StatesDevelopment of Wide-field Quantitative Multispectral Fluorescence-Reflectance Imaging Using an Ultrathin and Flexible Scanning Fiber Endoscope, Invited

Guoan Zheng, University of ConnecticutUnited StatesFourier Ptychography: A Computational Framework for High-Resolution, High-Throughput Imaging, Invited

Chairs

Joseph DallasAvo Photonics Inc, United States
Jess FordWeatherford International Ltd, United States
Dominik RabusBurkert Fluid Control Systems, Germany

Program Chairs

Thomas HaslettAvo Photonics Inc, United States
Sri Rama Prasanna PavaniExnodes, United States
Dominik RabusBurkert Fluid Control Systems, Germany
Arel WeisbergEnergy Research Co, United States

Members

Matthew Atkinson3M Company, United States
Elfed LewisUniversity of Limerick, Ireland
Sheng LiuKLA-Tencor Corp, United States
Hans-Peter LoockQueen's University - Chemistry, Canada
Gary MillerUS Naval Research Laboratory, United States
Georg MüllerABB Corporate Research, Switzerland
Marion O'FarrellSINTEF, Norway
Michael PowersGeneral Dynamics, United States
Sapna ShroffLight, United States
Arlene SmithUniversity of Michigan, United States
 
 

Congress Reception
Monday, 14 July
Join your fellow attendees for the Congress Reception. Enjoy delectable fare while networking. The reception is open to committee/presenting author/student and full conference attendees. Conference attendees may purchase extra tickets for their guest.

Joint Plenary Session
Tuesday, 15 July
The Joint Plenary Session will feature a speaker from three of the topical meetings (AIO, IS and LACSEA). The Plenary Presenters are listed below.

See Through Optical Architectures for Wearable Displays, Bernard Kress, Optics Lead, Advanced Technology Team, Google Glass Project, Google [X], USA

Ramesh Raskar, Associate Professor of Media Arts and Sciences, The Media Lab, MIT, Camera Culture Group, USA

In-Situ Laser Diagnostics in Gas-Phase Synthesis of Functional Nanomaterials, Christof Schulz, Institute for Combustion and Gas Dynamics – Reactive Fluids,University Duisburg Essen, Germany

Joint Poster Sessions
Tuesday, 15 July
Posters are an integral part of the technical program and offer a unique networking opportunity, where presenters can discuss their results one-to-one with interested parties. Each author is provided with a 4 ft. × 8 ft. (1.22 m × 2.44 m) board on which to display the summary and results of his or her paper.



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Wearable Technologies Conference 2014, USA