Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

23 - 27 June 2013
Renaissance Arlington Capital View, Arlington, Virginia, USA

Applied Industrial Optics offers a different networking and knowledge-sharing experience with a focus on the utilization of photonics and optical technology to solve real world problems.

At AIO, academic and industrial researchers with experience in overcoming the challenges of deploying and commercializing new technology will interact with research groups striving to get their technology out of the lab.

AIO will provide a platform for industry-driven research and product development like no other. This conference is about creating a collaborative environment with the following flow of information:

1.) Companies, research groups, and/or individuals with new and innovative optical technologies can share their technology developments while gaining a better understanding of what is required to successfully apply them in real world environments.

2.) Companies, research groups, and/or individuals who have already successfully applied optical technologies within diverse market segments can share their experiences and lessons learned.

3.) Companies can stay abreast of new technologies in the development pipeline that will enhance their product offerings and/or reveal new potential applications and emerging markets.
 

Topic Categories

  • Applied Spectroscopy
  • Emerging Laser, Fiber, and Photonics Technologies
  • Emerging optical technologies beyond the typical VIS/NIR spectral bands
  • Instrumentation
  • Imaging Systems
  • Microsystems, e.g. MOEMS, opto-microfluidics
  • Stand-off,  long distance, and remote sensing



Optical Fibre Sensors for Industrial Applications in the Safety and Security, PLENARY
Brian Culshaw, University of Strathclyde, United Kingdom,
Abstract: Optical fibre sensors appeared over 40 years ago.  Important prospects lie in safety and security.  This talk will explore why, and highlight successes, false starts and areas where more is needed for user acceptance.

Jarkko Antila, VTT Technical Research Centre of FinlandFinlandFabry-Perot Interferometer Spectral Engines for Imaging Applications, Invited

David Ash, DeNovix IncUnited StatesMicrovolume Spectrophotometric Analysis for Life Science Applications, Invited

Nicholas Barbi, PulseTorUnited StatesTajke-off Angle Imaging for Precise Image-X-ray Map Correlation in Scanning Electron Microscopy: The Application of Silicon Photomultipliers to Eelectron Imaging, Invited

R. Stephen Brown, Queen's University at KingstonCanadaA Fibre-Optic Coupled Fluorescence Multiwavelength Sensor for Automated Monitoring of Bacteria Culture from Drinking Water, Invited

Steven Buckley, TSI Inc.United StatesSorting of Aluminum and Scrap Metal using Laser-Induced Breakdown Spectroscopy, Invited

Francois Chateauneuf, Institut National d'OptiqueCanadaAeroMap: LiDAR for Real-time Aerosol Mapping and Control, Invited

Gregory Duckworth, OptaSenseUnited StatesDistributed Sensing Applications of Rayleigh Scattering in Fiber Optic Cables, Invited

Jess Ford, Weatherford International LtdUnited StatesDownhole Fluid and Analysis and Chemometric, Invited

Kay Gastinger, Norges Teknisk Naturvitenskapelige Univ NorwayFinding the Needle in the Haystack - Approaches for Detecting Small Defects on a Large Object, Invited

Gary Gimmestad, Georgia Tech Research InstituteUnited StatesNew Inversion Algorithms for Multi-Angle Lidar, Invited

Andrew Hmiel, Solar LightUnited StatesExposing Polymers to Xe arc UVA+B Focused Beams Enhances Accelerated Outdoor Simulations at Moderate Temperatures, Invited

Hong Hua, University of ArizonaUnited StatesLightweight, Low-cost Augmented Reality Displays Enabled by Freeform Optical Technology, Invited

Gary Miller, US Naval Research LaboratoryUnited StatesFiber Laser Sensors: From Prototype to Practical, Invited

Ram Narayanswamy, Intel Corp.United StatesComputational Imaging Platforms for Next Generation User Experience, Invited

Sinead O'Keeffe, University of LimerickIrelandOptical Fibre Luminescence Sensor for Real-time Radiotherapy Dosimetry, Invited

Wolfgang Osten, Institut für Technische OptikGermanyOptical Metrology and Inspection: From the Laboratory to the Real World, Invited

Heidi Ottevaere, Vrije Universiteit BrusselBelgiumMulti-channel, Multi-resolution Micro-optical Smart Imaging Systems, Invited

Michael Powers, General DynamicsUnited StatesProgress in Supercontinuum-based Spectral LIDAR and its Applications to Robotic Systems, Invited

Sabbir Rangwala, Princeton Lightwave IncUnited StatesShort Wave Infrared Wavelength (SWIR) Applications in Industrial Optics: Drivers and Challenges, Invited

Nathalie Renaud, Institut National d'OptiqueCanadaFusion of Hyperspectral Imaging and Fluorescence: System and Applications, Invited

Alan Ryder, Nanoscale Biophotonics Laboratory IrelandQuantitative Analysis of Complex Liquids using Multi-dimensional Fluorescence Spectroscopy: From Oil to Vegemite, Invited

Sapna Shroff, Ricoh Innovations, Corp. United StatesPlenoptic System Response and Image Formation, Invited

Tong Sun, City UniversityUnited KingdomPhotonic Crystal Fibres for Monitoring the Onset of Corrosion in Reinforced Concrete Structures, Invited

Xiaoli Sun, NASA Goddard Space Flight CenterUnited StatesSpace lidars - Interplanetary Laser Ranging and Communication Experiments Performed by NASA GSFC, Invited

Peter Torrione, New Folder ConsultingA New Quantitative Approach to LIBS: A Statistical Model for Elemental Analysis, Invited

General Chairs

Jess Ford, Weatherford International Ltd, United States
Marion O' Farrell, SINTEF, Norway

Program Chairs

Joseph Dallas, Avo Photonics Inc., USA
Sri Rama Prasanna Pavani, Arecont Vision, United States
Arel Weisberg, Energy Research Co, United States

Program Committee

Jarkko Antila, VTT Technical Research Centre of Finland, Finland
Matthew Atkinson, 3M Company, USA
Sean Christian, Weatherford International Ltd, USA
Jason Eichenholz, Open Photonics Inc., USA
Robert Kester, Rebellion Photonics, USA
Elfed Lewis, University of Limerick, Ireland
Hans-Peter Loock, Queen's University - Chemistry, Canada
Adam Phenis, SAIC, USA
Dominik Rabus, Festo AG & Co. KG, Germany
Sapna Shroff, Ricoh Innovations, Inc., USA
Arlene Smith, National University of Ireland Galway, Ireland
Weimin Sun, Harbin Engineering University, China
Florin Tatar, SKF, Netherlands
Yupeng Zhang, Kyushu University, Japan
Congress Reception
Monday 24 June, 19.00 – 20.30
Join your fellow attendees for the Congress Reception. Enjoy delectable fare while networking. The reception is open to committee/presenting author/student and full conference attendees. Conference attendees may purchase extra tickets for their guest.
 
Joint Poster Sessions
Tuesday 25, June, 16.30 – 18.00
Posters are an integral part of the technical program and offer a unique networking opportunity, where presenters can discuss their results one-to-one with interested parties. Each author is provided with a 4 ft. × 8 ft. (1.22 m × 2.44 m) board on which to display the summary and results of his or her paper.
  
AIO & COSI Joint Session
Wednesday, 26 June, 11.00 – 13.00
 
AIO & IS Joint Sessions
Wednesday, 26 June, 14.30 – 19.00

OSA - The Optical Society


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