Invited Speakers

Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)



Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

23 - 27 June 2013
Renaissance Arlington Capital View, Arlington, Virginia, USA

Invited Speakers


Optical Fibre Sensors for Industrial Applications in the Safety and Security, PLENARY
Brian Culshaw, University of Strathclyde, United Kingdom,
Abstract: Optical fibre sensors appeared over 40 years ago.  Important prospects lie in safety and security.  This talk will explore why, and highlight successes, false starts and areas where more is needed for user acceptance.

Jarkko Antila, VTT Technical Research Centre of Finland, Finland, Fabry-Perot Interferometer Spectral Engines for Imaging Applications, Invited

Nicholas Barbi, PulseTor, United States, Tajke-off Angle Imaging for Precise Image-X-ray Map Correlation in Scanning Electron Microscopy: The Applicaiton of Silicon Photomultipliers to Eelectron Imaging, Invited

Steven Buckley, TSI Inc., United States, Sorting of Aluminum and Scrap Metal using Laser-Induced Breakdown Spectroscopy, Invited

Francois Chateauneuf, Institut National d'Optique, Canada, AeroMap: LiDAR for Real-time Aerosol Mapping and Control, Invited

Gregory Duckworth, OptaSense, United States, Distributed Sensing Applications of Rayleigh Scattering in Fiber Optic Cables, Invited

Jess Ford, Weatherford International Ltd, United States, Downhole Fluid and Analysis and Chemometric, Invited

Kay Gastinger, Norges Teknisk Naturvitenskapelige Univ, Norway, Finding the Needle in the Haystack - Approaches for Detecting Small Defects on a Large Object, Invited

Gary Gimmestad, Georgia Tech Research Institute, United States, New Inversion Algorithms for Multi-Angle Lidar, Invited

Mike Hillier, Isomet Corp, United Kingdom, Exploring Acousto-Optic Devices and Applications: A Summary of AO Techniques and a Discussion on Present Day Applications in Science and Industry, Invited

Drew Hmiel, Solar Light, United States, Exposing Polymers to Xe arc UVA+B Focused Beams Enhances Accelerated Outdoor Simulations at Moderate Temperatures, Invited

Hong Hua, University of Arizona, United States, Lightweight, Low-cost Augmented Reality Displays Enabled by Freeform Optical Technology, Invited

Kevin Kelley, DeNovix Inc, United States, Microvolume Spectrophotometric Analysis for Life Science Applications, Invited

Gary Miller, US Naval Research Laboratory, United States, Fiber Laser Sensors: From Prototype to Practical, Invited

Ramkumar Narayanswamy, Intel Corporation, United States, Computational Imaging Platforms for Next Generation User Experience, Invited

Sinead O'Keeffe, University of Limerick, Ireland, Optical Fibre Luminescence Sensor for Real-time Radiotherapy Dosimetry, Invited

Wolfgang Osten, Universität Stuttgart, Germany, Optical Metrology and Inspection: From the Laboratory to the Real World, Invited

Heidi Ottevaere, Vrije Universiteit Brussel, Belgium, Multi-channel, Multi-resolution Micro-optical Smart Imaging Systems, Invited

Michael Powers, General Dynamics, United States, Progress in Supercontinuum-based Spectral LIDAR and its Applications to Robotic Systems, Invited

Sabbir Rangwala, Princeton Lightwave Inc, United States, Short Wave Infrared Wavelength (SWIR) Applications in Industrial Optics: Drivers and Challenges, Invited

Nathalie Renaud, Institut National d'Optique, Canada, Fusion of Hyperspectral Imaging and Fluorescence: System and Applications, Invited

Alan Ryder, Nanoscale Biophotonics Laboratory, Ireland, Quantitative Analysis of Complex Liquids using Multi-dimensional Fluorescence Spectroscopy: From Oil to Vegemite, Invited

Sapna Shroff, Ricoh Innovations, Inc., United States, Plenoptic System Response and Image Formation, Invited

Tong Sun, City University, United Kingdom, Photonic Crystal Fibres for Monitoring the Onset of Corrosion in Reinforced Concrete Structures, Invited

Xiaoli Sun, NASA Goddard Space Flight Center, United States, Space lidars - Interplanetary Laser Ranging and Communication Experiments Performed by NASA GSFC, Invited

Peter Torrione, New Folder Consulting, A New Quantitative Approach to LIBS: A Statistical Model for Elemental Analysis, Invited