Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

Imaging and Applied Optics

Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)

13 - 17 July 2014
Sheraton Seattle Hotel, Seattle, Washington, USA

Applied Industrial Optics offers a different networking and knowledge-sharing experience with a focus on the utilization of photonics and optical technology to solve real world problems.

At AIO, academic and industrial researchers with experience in overcoming the challenges of deploying and commercializing new technology will interact with research groups striving to get their technology out of the lab. Technical topics include instrumentation, imaging systems, applied spectroscopy, and emerging laser, fiber, and photonics technologies.

Topic Categories

  • Applied Spectroscopy
  • Emerging Laser, Fiber, and Photonics Technologies
  • Emerging optical technologies beyond the typical VIS/NIR spectral bands
  • Instrumentation
  • Imaging Systems
  • Microsystems, e.g. MOEMS, opto-microfluidics
  • Stand-off,  long distance, and remote sensing
  • Optical Sensing

Joseph Dallas
Avo Photonics Inc
United States

Jess Ford
Weatherford International Ltd
United States

Program Chair
Thomas Haslett
Avo Photonics Inc
United States

Program Chair
Sri Rama Prasanna Pavani
Arecont Vision
United States

Program Chair
Dominik Rabus
Burkert Fluid Control Systems

Program Chair
Arel Weisberg
Energy Research Co
United States

Program Chair

View Full Committee List


Hotel Reservation 11 June 2014 23:59 EDT
Hotel Reservation 11 June 2014
Advanced Registration 16 June 2014 23:59 EDT
Advanced Registration 16 June 2014
Bernard Kress, Google, United States, Plenary

David Allen, National Inst of Standards & Technology, United States, Standards and Methods for the Evaluation of Hyperspectral Imaging System Performance , Invited

Sterling Backus, Kapteyn-Murnane Laboratories, United States, High Peak and Average Power Near/Mid-IR Femtosecond Laser Sources, Invited

Kate Bechtel, Triple Ring Technologies, United States, Spatially-Resolved Diffuse Reflectance Measurements for Oximetry , Invited

Rene Beigang, Technische Universit├Ąt Kaiserslautern, Germany, Industrial Applications of Terahertz Technology: From layer thickness measurements to mail screening , Invited

David Brady, Duke University, United States, Roadmap for Commercial Gigapixel Cameras , Invited

Alexandre Brolo, University of Victoria, Canada, Tailoring Metallic Nanostructures for Surface-Enhanced Spectroscopy , Invited

Steven Buckley, TSI Inc., United States, LIBS in the Laboratory and Beyond , Invited

Hui Cao, Yale University , United States, Using the Random Nano-photonic Structure on a Silicon Chip to make a Spectrometer , Invited

Brian Cunningham, Univ of Illinois at Urbana-Champaign, United States, Smartphone Biosensors for Health, Environment, and Food Safety , Invited

View All Invited Speakers

Congress Special Events

Congress Reception
Monday, 14 July
Join your fellow attendees for the Congress Reception. Enjoy delectable fare while networking. The reception is open to committee/presenting author/student and full conference attendees. Conference attendees may purchase extra tickets for their guest.

General Session with Plenary Speakers
Tuesday, 15 July
Please check back in Spring 2014 for complete information about the Plenary Speakers.

Joint Poster Sessions
Tuesday, 15 July
Posters are an integral part of the technical program and offer a unique networking opportunity, where presenters can discuss their results one-to-one with interested parties. Each author is provided with a 4 ft. × 8 ft. (1.22 m × 2.44 m) board on which to display the summary and results of his or her paper.

OSA - The Optical Society