13 May 2013 - 16 May 2013
Take this opportunity to submit your research to the international SPIE Optical Metrology 2013. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical metrology. The conference focuses on new optical principles and systems for metrology, videometrics and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, bio technology, vehicle navigation, multimedia technology, architecture, archaeology and arts. Special emphasis is directed to model-based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modelling, biomaterials characterization as well as to the preservation of our shared cultural heritage. Optical Metrology addresses attendees like engineers, scientists, researchers, trustees and managers.