OSA
The Optical Society

Advancing the Science and Technology of Light

Applied Industrial Optics: Spectroscopy, Imaging, & Metrology (AIO)

24 June - 28 June 2012, Monterey Plaza Hotel, Monterey, California, United States


Plenary Speaker

McEldowneyMicrosoft Kinect - A Look Inside, Scott McEldowney, Microsoft, USA
Abstract: Kinect is a state-of-the-art depth, video, and audio sensor that allows individuals to naturally interact with devices. This presentation summarizes Kinect development focusing on challenges involved in transition from technology to product.


Invited Speakers

Direct Real-Time Determination of Compositional Profiles in Structured Materials Using Laser Ablation Instruments: LIBS and LA-ICP-MS, Alexander Bol’shakov, Applied Spectra, Inc., USA

Structured Light Optical Super-Resolution: Encoding for Limited Optical Bandwidth, Marc Christensen, Southern Methodist University, USA

Trace Gas Detection Using a Broadband Continuous Wave-Cavity Ringdown Spectrometer, Erika Coyne, Tiger Optics, USA

Measuring Thermal Properties of Coal with a Commercial Bench Top LIBS System, Joseph Craparo, Energy Research Co., USA

Advances in Laser Assisted Microwave Plasma Spectroscopy, Philip Efthimion, Envimetics, USA

Rapid Low Cost Electro-Optic Prototyping for Space Through Use of Cubesats, Renny Field, The Aerospace Corporation, USA

Dielectric Optical Resonators for Strain Sensing and Chemical Detection, Gianluca Gagliardi, CNR-Istituto Nazionale di Ottica Applicata (INOA), Italy

Optical Fiber Chemical Sensors for Process and Environmental Monitoring, Pierre Galarneau, National Institute for Optics, Norway

Laser-induced Breakdown Spectroscopy for the Standoff Detection of Explosive Residues, Jennifer Gottfried, US Army Research Laboratory, USA

Low Cost Real-Time Sorting of In-Shell Pistachio Nuts from Kernels, Ron Haff, Western Regional Research Center Imaging and Sorting Lab, USA

Rugged Micro-Optic Packaging for Extreme Environments, Tom Haslett, Avo Photonics Inc., USA

MEMS Deformable Mirrors: From Retinal Imaging to Industrial Laser Systems, Michael Helmbrecht, IrisAO, USA

Novel Diffractive Gas Sensors, Ib-Rune Johansen, SINTEF, Norway

Use of Hyperspectral Imaging for Pharmaceutical Formulation Development, Gabor Kemeny, Middleton Research, USA

A Real-time Gas Cloud Imaging Camera for Fugitive Emission Detection and Monitoring, Robert Kester, Rebellion Photonics, USA

Exploiting High Efficiencies in a Deep LED Water Treatment Device, Oliver Lawal, Aquionics, USA

Optical Design Consideration for Polarization and Fluorescence Imaging, Rongguang Liang, Univ. of Arizona, USA

CMOS Angle Sensitive Pixels for 3-D Imaging, Alyosha Molnar, Cornell Univ. USA

Monolithic Waveguide Spectrometer for Mid-Infrared Applications, Eric Olson, Spectro Inc., USA

Integrated Polymer Optofluidic Chips, Heidi Ottevaere, Vrije Universiteit Brussel, Belgium

Lensfree On-Chip Microscopy and Tomography Toward Telemedicine Applications, Aydogan Ozcan, Univ. of California Los Angeles, USA

In-line Characterization of Highly Concentrated Industrial Dispersions by Photon Density Wave Spectroscopy, Oliver Reich, Univ. of Potsdam, Germany

Model Guided Multi-modal Multi-scale Image Integration for Head and Neck Anatomy, Anand Santhanam & Jannick Rolland, Univ. of Rochester, USA

Laser Induced Breakdown Spectroscopy (LIBS) for Real Time Analysis of Materials: Challenges and Future, Mohamad Sabsabi, National Research Council, Canada

Wireless Infrared Gas Sensor, Håkon Sagberg, GasSecure, Norway

Automatic Sorting of Meat Cuts using NIR Interactance Imaging, Vegard Segtnan, Nofima Mat, Norway

A Miniature Laser Cooled Atomic Frequency Reference, Vishal Shah, Symmetricom, USA

Rapid Determination of Hydrocarbon Reservoir Quality Properties at the Wellsite by Energy Dispersive X-ray Fluorescence Spectroscopy (ED-XRF), Christopher Smith, Weatherford International, USA

Wave-field Imaging with Partially Coherent Light , Laura Waller, Princeton Univ., USA

Photo-cosmetic Applications Using Semiconductor Diode Lasers, Stewart Wilson, Palomar Medical Technologies, USA

Chemical and Topographic Sample Analysis for the Milli- and Micrometer Range, Jianyong Yang, WITec Instruments Corp, USA

Important Information

Important Dates

  • Post Deadline Submission Deadline 25 May 2012 16.00 GMT
  • Early Registration Deadline 30 May 2012